Part III
Pattern Fitting

10 Overview: Fitting diffraction patterns
11 Fitting Background
11.1 Background Computation Modes
11.2 Approaches to Fitting Background
11.3 Defining Fixed Background Points
11.4 The Auto-Background Feature
11.5 Negative Uiso values
12 Fitting Peak Positions
12.1 Ensuring partial peak alignment
12.2 Sample displacement parameters
12.3 Visual inspection tips
12.4 Lattice Parameter Precision and Accuracy
13 Fitting Peak Intensities
13.1 Parameters that Affect Computed Intensities
13.2 The intensity fitting process
13.3 How to know when the fit is good enough?
14 Fitting Profile functions
14.1 Peak broadening contributions convolute
14.2 Sources of instrumental broadening
14.3 Sample broadening
14.4 Approaches for peak fitting functions
14.5 Physically-Inspired Peak Shapes
14.6 GSAS-II Profile Implementation
14.7 GSAS-II Sample Broadening Terms
14.8 GUI Access to Sample Broadening Terms
14.9 GSAS-II Sample Broadening Visualization
14.10 Determining Instrumental Profile Terms
14.11 FPA Generation of Instrumental Terms
14.12 How to Refine Peak Profiles for a Sample
14.13 Constraints on broadening terms
14.14 The Warren-Averbach Method
14.15 Parting words on Profile Fitting